Note: Program subject to change without notice

Thursday, November 8, 2007: 9:25 AM
340: Genetics of Disease Resistance and Transgenic Crops
Sponsor: C07 Genomics, Molecular Genetics & Biotechnology
Presiding: David Lightfoot, Southern Illinois University
  Introductory Remarks
  QTL Analysis and Genetic Dissection of Quantitative Resistance to Southern Leaf Blight in Maize.
John Zwonitzer, North Carolina State University, David Bubeck, Pioneer Hi-Bred International, Inc., Dinakar Bhattramakki, Pioneer Hi-Bred International, Inc, Major Goodman, North Carolina State University, Peter Balint-Kurti, USDA-ARS, Deptartment of Plant Pathology
  The Molecular Basis of Resistance to the Soybean Cyst Nematode.
Ahmed Afzal, Southern Illinois University, Hany El-Shemy, Southern Illinois University, Navinder Saini, Southern Illinois University, Sheeja Vasudevan, Southern Illinois University, Jiazheng Yuan, Southern Illinois University, David Lightfoot, Southern Illinois University
  Herbicide Efficacy and Yield Evaluations of Soybeans with the Optimum(TM) GAT(TM) Trait.
Jeffrey Hegstad, Pioneer Hi-Bred International, Inc., Mark Vogt, Pioneer Hi-Bred International, Inc., Sara Fischer, Pioneer Hi-Bred International, Inc., Dan Sherman, Pioneer Hi-Bred International, Inc., Janel Albertsen, Pioneer Hi-Bred International, Inc., Lori Wickham, Pioneer Hi-Bred International, Inc., Daria Schmidt, Pioneer Hi-Bred International, Inc.
  Herculex® Family of Corn Insect Protection Traits: Commercial and Research Updates.
Ed King, Dow AgroSciences, Paul Neese, Dow AgroSciences, Mike Culy, Dow AgroSciences, Gary Thompson, Dow AgroSciences
  Adjourn

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